Noel Rodríguez Santiago

Administrative data

Full member researcher

  • Position in UGR: Tenure professor
    Department where s/he teaches: Electrónica y Tecnología de Computadores
    Research group: TIC-250

Contributions and research experience

Publications in ISI SCI

  • Systematic method for electrical characterization of random telegraph noise in MOSFETs
    Author-s: Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ohata, Akiko
    Source: SOLID-STATE ELECTRONICS 128 115 120 2017
  • Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation
    Author-s: Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ruiz, Rafael; Ohata, Akiko
    Source: SOLID-STATE ELECTRONICS 117 60 65 2016
  • Novel Capacitorless 1T-DRAM Cell for 22-nm Node Compatible With Bulk and SOI Substrates
    Author-s: Rodriguez, Noel; Cristoloveanu, Sorin; Gamiz, Francisco
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 58 8 2371 2377 2011
  • Capacitor-less A-RAM SOI memory: Principles, scaling and expected performance
    Author-s: Rodriguez, Noel; Cristoloveanu, Sorin; Gamiz, Francisco
    Source: SOLID-STATE ELECTRONICS 59 1 44 49 6th Workshop of the Thematic Network on Silicon on JAN 25-27, 2010 Grenoble, Grenoble 2011
  • An Analytical I-V Model for Surrounding-Gate Transistors That Includes Quantum and Velocity Overshoot Effects
    Author-s: Roldan, J. B.; Gamiz, Francisco; Jimenez-Molinos, F.; Sampedro, Carlos; Godoy, Andres; Garcia Ruiz, Francisco J.; Rodriguez, Noel
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 57 11 2925 2933 2010
  • A-RAM Memory Cell: Concept and Operation
    Author-s: Rodriguez, Noel; Gamiz, Francisco; Cristoloveanu, Sorin
    Source: IEEE ELECTRON DEVICE LETTERS 31 9 972 974 2010
  • Why the Universal Mobility Is Not
    Author-s: Cristoloveanu, Sorin; Rodriguez, Noel; Gamiz, Francisco
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 57 6 1327 1333 2010
  • Hole transport in DGSOI devices: Orientation and silicon thickness effects
    Author-s: Donetti, L.; Gamiz, F.; Rodriguez, N.; Jimenez-Molinos, F.; Roldan, J. B.
    Source: SOLID-STATE ELECTRONICS 54 2 191 195 5th Workshop of the Thematic-Network-on-Silicon-on JAN 19-21, 2009 Chalmers Univ Technol, Chalmers Univ Technol, Chalmers Univ Technol 2010
  • Hole Mobility in Ultrathin Double-Gate SOI Devices: The Effect of Acoustic Phonon Confinement
    Author-s: Donetti, Luca; Gamiz, Francisco; Rodriguez, Noel; Godoy, Andres
    Source: IEEE ELECTRON DEVICE LETTERS 30 12 1338 1340 2009
  • Non-metallic effects in silicided gate MOSFETs
    Author-s: Rodriguez, Noel; Gamiz, Francisco; Clerc, Raphael; Sampedro, Carlos; Godoy, Andres; Ghibaudo, Gerard
    Source: SOLID-STATE ELECTRONICS 53 12 1313 1317 10th International Conference on Ultimate Integrat MAR, 2009 Aachen, Aachen 2009
  • Revisited Pseudo-MOSFET Models for the Characterization of Ultrathin SOI Wafers
    Author-s: Rodriguez, Noel; Cristoloveanu, Sorin; Gamiz, Francisco
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 56 7 1507 1515 2009
  • Simulation of hole mobility in two-dimensional systems
    Author-s: Donetti, Luca; Gamiz, Francisco; Rodriguez, Noel
    Source: SEMICONDUCTOR SCIENCE AND TECHNOLOGY 24 3 -1 -1 2009
  • The quantization impact of accumulated carriers in silicide-gated MOSFETs
    Author-s: Rodriguez, Noel; Gamiz, Francisco; Clerc, Raphael; Ghibaudo, Gerard; Cristoloveanu, Sorin
    Source: IEEE ELECTRON DEVICE LETTERS 29 6 628 631 2008
  • Modeling of inversion layer centroid and polysilicon depletion effects on ultrathin-gate-oxide MOSFET behavior: The influence of crystallographic orientation
    Author-s: Rodriguez, Noel; Gamiz, Francisco; Roldan, Juan B.
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 54 4 723 732 2007
  • An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
    Author-s: Rodriguez, N.; Roldan, J. B.; Gamiz, F.
    Source: SEMICONDUCTOR SCIENCE AND TECHNOLOGY 22 4 348 353 2007
  • Phonon scattering in Si-based nanodevices
    Author-s: Donetti, L.; Gamiz, F.; Rodriguez, N.; Ruiz, F. G.
    Source: SOLID-STATE ELECTRONICS 51 4 593 597 7th International Conference on Ultimate Integrati APR 20-21, 2006 Grenoble, Grenoble 2007
  • Characterization of electron transport at high fields in silicon-on-insulator devices: a Monte Carlo study
    Author-s: Roldan, JB; Gamiz, I; Roldan, A; Rodriguez, N
    Source: SEMICONDUCTOR SCIENCE AND TECHNOLOGY 21 1 81 86 2006
  • Evidence for mobility enhancement in double-gate silicon-on-insulator metal-oxide-semiconductor field-effect transistors
    Author-s: Rodriguez, N.; Cristoloveanu, S.; Gamiz, F.
    Source: JOURNAL OF APPLIED PHYSICS 102 8 -1 -1 2007
  • The effect of surface roughness scattering on hole mobility in double gate silicon-on-insulator devices
    Author-s: Donetti, Luca; Gamiz, Francisco; Rodriguez, Noel; Godoy, Andres; Sampedro, Carlos
    Source: JOURNAL OF APPLIED PHYSICS 106 2 -1 -1 2009
  • Influence of acoustic phonon confinement on electron mobility in ultrathin silicon on insulator layers
    Author-s: Donetti, L; Gamiz, F; Rodriguez, N; Jimenez, F; Sampedro, C
    Source: APPLIED PHYSICS LETTERS 88 12 -1 -1 2006
  • Electrical characterization and conductivity optimization of laser reduced graphene oxide on insulator using point-contact methods
    Author-s: Marquez, Carlos; Rodriguez, Noel; Ruiz, Rafael; Gamiz, Francisco
    Source: RSC ADVANCES 6 52 46231 46237 2016
  • Multi-Subband Ensemble Monte Carlo simulation of bulk MOSFETs for the 32 nm-node and beyond
    Author-s: Sampedro, C.; Gamiz, F.; Godoy, A.; Valin, R.; Garcia-Loureiro, A.; Rodriguez, N.; Tienda-Luna, I. M.; Martinez-Carricondo, F.; Biel, B.
    Source: SOLID-STATE ELECTRONICS 65-66 88 93 40th European Solid-State Device Research Conferen SEP 14-16, 2010 Seville, Seville 2011

Conferences in ISI CPCI-Science

  • Electrical Characterization of Random Telegraph Noise in Back-Biased Ultrathin Silicon-On-Insulator MOSFETs
    Author-s: Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ohata, Akiko
    Source: 2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SI 40 43 2nd Joint International EUROSOI Workshop and Inter JAN 25-27, 2016 TU Wien, Inst Microelectron, Vienna, AUSTRIA 2016
  • Properties of 22nm node extremely-thin-SOI MOSFETs
    Author-s: Rodriguez, N.; Andrieu, F.; Navarro, C.; Faynot, O.; Gamiz, F.; Cristoloveanu, S.
    Source: 2011 IEEE INTERNATIONAL SOI CONFERENCE -1 -1 IEEE International SOI Conference OCT 03-06, 2011 Tempe, Tempe 2011
  • Self-Heating Effects in ultrathin FD SOI transistors
    Author-s: Rodriguez, N.; Navarro, C.; Andrieu, F.; Faynot, O.; Gamiz, F.; Cristoloveanu, S.
    Source: 2011 IEEE INTERNATIONAL SOI CONFERENCE -1 -1 IEEE International SOI Conference OCT 03-06, 2011 Tempe, Tempe 2011
  • New Capacitorless Dynamic Memory Compatible with SOI and Bulk CMOS
    Author-s: Rodriguez, N.; Gamiz, F.; Cristoloveanu, S.
    Source: ADVANCED SEMICONDUCTOR-ON-INSULATOR TECHNOLOGY AND RELATED PHYSICS 15 35 5 195 200 15th International Symposium on Advanced Semicondu MAY 01-06, 2011 Montreal, Montreal 2011
  • CHARACTERIZATION, MODELLING AND SIMULATION OF SUB-45NM SOI DEVICES
    Author-s: Rodriguez, Noel; Gamiz, Francisco; Cristoloveanu, Sorin
    Source: CAS: 2009 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS 57 63 32nd International Semiconductor Conference OCT 12-14, 2009 Sinaia, Sinaia 2009
  • A revisited pseudo-MOSFET model for ultrathin SOI films
    Author-s: Rodriguez, N.; Cristoloveanu, S.; Gamiz, F.
    Source: 2008 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS 65 66 IEEE International SOI Conference OCT 06-09, 2008 New Platz, New Platz 2008
  • Fully self-consistent k . p solver and Monte Carlo simulator for hole inversion layers
    Author-s: Donetti, Luca; Gamiz, Francisco; Godoy, Andres; Rodriguez, Noel
    Source: ESSDERC 2008: PROCEEDINGS OF THE 38TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE 254 257 38th European Solid-State Device Research Conferen SEP 15-19, 2008 Edinburgh, Edinburgh 2008
  • Mobility issues in double-gate SOI MOSFETs: Characterization and analysis
    Author-s: Rodriguez, N.; Cristoloveanu, S.; Nguyen, L. Pham; Garniz, F.
    Source: ESSDERC 2007: PROCEEDINGS OF THE 37TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE 271 274 37th European Solid-State Device Research Conferen SEP 11-13, 2007 Technische Univ Munchen, Technische Univ Munchen, Technische Univ Munchen 2007
  • Anisotropy of electron mobility in arbitrarily oriente FinFETs
    Author-s: Gamiz, Francisco; Donetti, Luca; Rodriguez, Noel
    Source: ESSDERC 2007: PROCEEDINGS OF THE 37TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE 378 381 37th European Solid-State Device Research Conferen SEP 11-13, 2007 Technische Univ Munchen, Technische Univ Munchen, Technische Univ Munchen 2007
  • Geometric Magnetoresistance and Mobility Behavior in Single-Gate and Double-Gate SOI Devices
    Author-s: Rodriguez, N.; Doneth, L.; Gamiz, F.; Cristoloveanu, S.
    Source: 2007 IEEE INTERNATIONAL SOI CONFERENCE PROCEEDINGS 51 52 IEEE International SOI Conference OCT 01-04, 2007 Indian Wells, Indian Wells 2007

Book chapters in ISI

  • Quantization Effects in Silicided and Metal Gate MOSFETs.
    Author-s: Rodriguez, N.; Gamiz, F.; Clerc, R.; Sampedro, C.; Godoy, A.; Ghibaudo, G.
    Source: ULIS 2009: 10TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION OF SILICON 103 106 10th International Conference on Ultimate Integrat MAR 18-20, 2009 Aachen, Aachen 2009
  • A-RAM: Novel capacitor-less DRAM memory
    Author-s: Rodriguez, Noel; Cristoloveanu, Sorin; Gamiz, Francisco
    Source: 2009 IEEE INTERNATIONAL SOI CONFERENCE 139 140 IEEE International SOI Conference 2009 OCT 05-08, 2009 Foster City, Foster City 2009
  • Enhanced electron transport by carrier overshoot in ultrascaled Double Gate MOSFETs
    Author-s: Rodriguez, Noel; Donetti, Luca; Sampedro, Carlos; Martinez-Carricondo, Francisco; Gamiz, Francisco
    Source: ULIS 2008: PROCEEDINGS OF THE 9TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON 203 206 9th International Conference on Ultimate Integrati MAR 13-14, 2008 Univ Udine, Univ Udine, Univ Udine 2008

Local Projects

  • CAMOCOIMOS: Caracterización, Modelado y Control de Ionización por impacto en transistores MOSFET-SOI nanométricos
    Principal Investigator: Noel Rodríguez Santiago
    Reference: CEI2014-MPTIC12
    Start date: 2014-05-28
    End date: 2014-12-31
    Research Group: TIC-250
    Amount to UGR: 3000.00
    Funding Agency: CEI-BioTIC: consorcio UGR, CSIC y Parque Tecnológico de la Salud Granada
    Program: Micro-proyectos de investigación financiados por el CEI BioTIC
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Patents and protected results

  • RAM MEMORY POINT WITH A TRANSISTOR
    Inventors: Noel Rodríguez Santiago, Francisco Jesús Gámiz Pérez
    Reference: WO/2013/050707
    Priority date: 2011-10-04
    Applicant: Centre National de la Recherche Scientifique, Universidad de Granada
    Research group: TIC-250,TIC-216
    Scope: mundial
  • RAM Memory Element with one transistor
    Inventors: Noel Rodríguez Santiago, Francisco Jesús Gámiz Pérez, Sorin Cristoloveanu
    Reference: PCT/FR2010/050716
    Priority date: 2009-04-15
    Patent exploitation: ninguna
    Applicant: Centre National de la Recherche Scientifique, Universidad de Granada
    Research group: TIC-250,TIC-216
    Scope: nacional
  • Point mémoire RAM à un transistor
    Inventors: Noel Rodríguez Santiago, Francisco Jesús Gámiz Pérez, Sorin Cristoloveanu
    Reference: FR1052612
    Applicant: Centre National de la Recherche Scientifique, Universidad de Granada
    Research group: TIC-250,TIC-216
    Scope: otro país

Doctoral Dissertations supervised

  • Electrical Characterization of Reliability in Advanced Silicon-On-Insulator Structures for sub-22nm Technologies
    Author: Carlos Márquez González
    Institution: Electrónica y Tecnología de Computadores (UGR),
    Dissertation date: 2017-03-23
    Supervision: Noel Rodríguez Santiago, Francisco Jesús Gámiz Pérez
    Special mention: internacional
  • Application of the Pseudo-MOSFET Technique on Silicon-On-Insulator Wafers
    Author: Cristina Fernández Sánchez
    Institution: Electrónica y Tecnología de Computadores (UGR),
    Dissertation date: 2016-07-22
    Supervision: Noel Rodríguez Santiago, Francisco Jesús Gámiz Pérez
  • Design, simulation and electrical characterization of A2RAM memory cells
    Author: Carlos Navarro Moral
    Institution: Electrónica y Tecnología de Computadores (UGR),
    Dissertation date: 2014-02-18
    Supervision: Noel Rodríguez Santiago, Francisco Jesús Gámiz Pérez
    Special mention: internacional

Research visits

  • INSTITUT DE MICROÉLECTRONIQUE, ELECTROMAGNÉTISME ET PHOTONIQUE (IMEP) ET LABORATORIE D¿HYPERFRÉQUENCES ET DE CARACTÉRISATION (LAHC)
    Visiting researcher: Rodríguez Santiago, Noel
    Research group: TIC-250
    Place: GRENOBLE; FRANCIA
    Start date: 2009-01-21
    End date: 2009-02-19
    Visiting category: INV
  • INSTITUT DE MICROÉLECTRONIQUE, ÉLECTROMAGNÉTISME ET PHOTONIQUE-IMEP-LAHC-MINATEC
    Visiting researcher: Rodríguez Santiago, Noel
    Research group: TIC-250
    Place: GRENOBLE; FRANCIA
    Start date: 2006-11-01
    End date: 2007-10-31
  • INSTITUT DE MICROÉLECTRONIQUE, ÉLECTROMAGNÉTISME ET PHOTONIQUE
    Visiting researcher: Rodríguez Santiago, Noel
    Research group: TIC-250
    Place: GRENOBLE; FRANCIA
    Start date: 2006-10-01
    End date: 2006-10-31
    Visiting category: INV
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