Juan Antonio Jiménez Tejada

Fotografía a baja resolución

Juan Antonio Jiménez Tejada

Administrative data

Full member researcher

  • Position in UGR: Professor
    Department where s/he teaches: Electrónica y Tecnología de Computadores
    Research group: TIC-105

Contributions and research experience

Publications in ISI SCI

  • Organic thin film transistors using a liquid crystalline palladium phthalocyanine as active layer
    Author-s: Jimenez Tejada, Juan A.; Lopez-Varo, Pilar; Chaure, Nandu B.; Chambrier, Isabelle; Cammidge, Andrew N.; Cook, Michael J.; Jafari-Fini, Ali; Ray, Asim K.
    Source: JOURNAL OF APPLIED PHYSICS 123 11 0 0 2018
  • Physical aspects of ferroelectric semiconductors for photovoltaic solar energy conversion
    Author-s: Lopez-Varo, Pilar; Bertoluzzi, Luca; Bisquert, Juan; Alexe, Marin; Coll, Mariona; Huang, Jinsong; Antonio Jimenez-Tejada, Juan; Kirchartz, Thomas; Nechache, Riad; Rosei, Federico; Yuan, Yongbo
    Source: PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS 653 1 40 2016
  • Charge density at the contacts of symmetric and asymmetric organic diodes
    Author-s: Lopez-Varo, P.; Jimenez-Tejada, J. A.; Marinov, O.; Chen, C. H.; Deen, M. J.
    Source: ORGANIC ELECTRONICS 35 74 2016
  • Space-charge and injection limited current in organic diodes: A unified model
    Author-s: Lopez Varo, P.; Jimenez Tejada, J. A.; Lopez Villanueva, J. A.; Deen, M. J.
    Source: ORGANIC ELECTRONICS 15 10 2526 2535 2014
  • Electrical characterization of controlled and unintentional modified metal-organic contacts
    Author-s: Lopez Varo, P.; Jimenez Tejada, J. A.; Lopez Villanueva, J. A.; Deen, M. J.
    Source: ORGANIC ELECTRONICS 15 10 2536 2545 2014
  • Compact Modeling and Contact Effects in Thin Film Transistors
    Author-s: Jimenez Tejada, Juan Antonio; Lopez Villanueva, Juan Antonio; Lopez Varo, Pilar; Awawdeh, Karam M.; Deen, M. Jamal
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 61 2 266 277 2014
  • Characterization of organic thin film transistors with hysteresis and contact effects
    Author-s: Awawdeh, K. M.; Jimenez Tejada, J. A.; Lopez Varo, P.; Lopez Villanueva, J. A.; Gomez Campos, F. M.; Deen, M. J.
    Source: ORGANIC ELECTRONICS 14 12 3286 3296 2013
  • Dependence of Generation-Recombination Noise With Gate Voltage in FD SOI MOSFETs
    Author-s: Luque Rodriguez, Abraham; Jimenez Tejada, Juan A.; Rodriguez-Bolivar, Salvador; Almeida, Luciano Mendes; Aoulaiche, Marc; Claeys, Cor; Simoen, Eddy
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 59 10 2780 2786 2012
  • Modeling the transition from ohmic to space charge limited current in organic semiconductors
    Author-s: Lopez Varo, P.; Jimenez Tejada, J. A.; Lopez Villanueva, J. A.; Carceller, J. E.; Deen, M. J.
    Source: ORGANIC ELECTRONICS 13 9 1700 1709 2012
  • Thin-Film-Transistor Modelling for Circuit Simulation
    Author-s: Jimenez Tejada, Juan A.
    Source: IET CIRCUITS DEVICES & SYSTEMS 6 2 111 112 2012
  • Effects of Gate Oxide and Junction Nonuniformity on the DC and Low-Frequency Noise Performance of Four-Gate Transistors
    Author-s: Jimenez Tejada, Juan A.; Luque Rodriguez, Abraham; Godoy, Andres; Rodriguez-Bolivar, Salvador; Lopez Villanueva, Juan A.; Marinov, Ognian; Deen, M. Jamal
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 59 2 459 467 2012
  • Impact of Ge Content and Recess Depth on the Leakage Current in Strained Si1-xGex/Si Heterojunctions
    Author-s: Luque Rodriguez, Abraham; Gonzalez, Mireia Bargallo; Eneman, Geert; Claeys, Cor; Kobayashi, Daisuke; Simoen, Eddy; Jimenez Tejada, Juan A.
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 58 8 2362 2370 2011
  • Impact of the fringing capacitance at the back of thin-film transistors
    Author-s: Marinov, Ognian; Deen, M. Jamal; Jimenez Tejada, Juan Antonio; Iniguez, Benjamin
    Source: ORGANIC ELECTRONICS 12 6 936 949 2011
  • Contact effects in compact models of organic thin film transistors: Application to zinc phthalocyanine-based transistors
    Author-s: Jimenez Tejada, J. A.; Awawdeh, K. M.; Lopez Villanueva, J. A.; Carceller, J. E.; Deen, M. J.; Chaure, N. B.; Basova, Tamara; Ray, A. K.
    Source: ORGANIC ELECTRONICS 12 5 832 842 2011
  • Miniband structure and photon absorption in regimented quantum dot systems
    Author-s: Rodriguez-Bolivar, S.; Gomez-Campos, F. M.; Luque-Rodriguez, A.; Lopez-Villanueva, J. A.; Jimenez-Tejada, J. A.; Carceller, J. E.
    Source: JOURNAL OF APPLIED PHYSICS 109 7 -1 -1 2011
  • Evaluation of the charge density in the contact region of organic thin film transistors
    Author-s: Lara Bullejos, P.; Jimenez Tejada, J. A.; Gomez-Campos, F. M.; Deen, M. J.; Marinov, O.
    Source: JOURNAL OF APPLIED PHYSICS 106 9 -1 -1 2009
  • A low-frequency noise model for four-gate field-effect transistors
    Author-s: Jimenez Tejada, Juan Antonio; Rodriguez, Abraham Luque; Godoy, Andres; Villanueva, Juan A. Lopez; Gomez-Campos, Francisco M.; Rodriguez-Bolivar, Salvador
    Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 55 3 896 903 2008
  • A qualitative study of the influence of confinement direction on phonon and interface roughness scattering in p-type FD/SOI devices
    Author-s: Gomez-Campos, FM; Rodriguez-Bolivar, S; Jimenez-Tejada, JA; Carceller, JE
    Source: SOLID-STATE ELECTRONICS 49 9 1454 1460 1st EUROSOI Workshop JAN 19-21, 2005 Granada, Granada 2005
  • A solution of the effective-mass Schrodinger equation in general isotropic and nonparabolic bands for the study of two-dimensional carrier gases
    Author-s: Gomez-Campos, FM; Rodriguez-Bolivar, S; Lopez-Villanueva, JA; Jimenez-Tejada, JA; Carceller, JE
    Source: JOURNAL OF APPLIED PHYSICS 98 3 -1 -1 2005
  • A simple model for analysing the effects of band non-parabolicity in nanostructures
    Author-s: Lopez-Villanueva, JA; Jimenez-Tejada, JA; Palma, A; Bolivar, SR; Carceller, JE
    Source: SEMICONDUCTOR SCIENCE AND TECHNOLOGY 20 6 532 539 2005
  • Generation-recombination noise in highly asymmetrical p-n junctions
    Author-s: Tejada, JAJ; Godoy, A; Palma, A; Villanueva, JAL
    Source: JOURNAL OF APPLIED PHYSICS 92 1 320 329 2002
  • Temperature dependence of generation-recombination noise in p-n junctions
    Author-s: Tejada, JAJ; Godoy, A; Palma, A; Cartujo, P
    Source: JOURNAL DE PHYSIQUE IV 12 PR3 71 74 5th European Workshop on Low Temperature Electroni JUN 19-21, 2002 GRENOBLE, GRENOBLE 2002
  • A simple subthreshold swing model for short channel MOSFETs
    Author-s: Godoy, A; Lopez-Villanueva, JA; Jimenez-Tejada, JA; Palma, A; Gamiz, F
    Source: SOLID-STATE ELECTRONICS 45 3 391 397 2001
  • Optimum design in a JFET for minimum generation-recombination noise
    Author-s: Godoy, A; Jimenez-Tejada, JA; Palma, A; Carceller, JE
    Source: MICROELECTRONICS RELIABILITY 40 11 1965 1968 2000
  • Influence of mobility fluctuations on random telegraph signal amplitude in n-channel metal-oxide-semiconductor field-effect transistors
    Author-s: Godoy, A; Gamiz, F; Palma, A; JimenezTejada, JA; Banqueri, J; LopezVillanueva, JA
    Source: JOURNAL OF APPLIED PHYSICS 82 9 4621 4628 1997
  • Influence of the doping profile and deep level trap characteristics on generation-recombination noise
    Author-s: Godoy, A; JimenezTejada, JA; Palma, A; Cartujo, P
    Source: JOURNAL OF APPLIED PHYSICS 82 7 3351 3357 1997
  • Anomalous behaviour of the electric field in highly-compensated non-uniform semiconductors at low temperatures
    Author-s: JimenezTejada, JA; Palma, A; Godoy, A; Carceller, JE
    Source: JOURNAL DE PHYSIQUE IV 6 C3 99 103 2nd European Workshop on Low Temperature Electroni JUN 26-28, 1996 LOUVAIN, LOUVAIN 1996
  • Capture process by shallow donors in silicon at low temperatures
    Author-s: Palma, A; JimenezTejada, JA; Godoy, A; Cartujo, P
    Source: JOURNAL DE PHYSIQUE IV 6 C3 105 110 2nd European Workshop on Low Temperature Electroni JUN 26-28, 1996 LOUVAIN, LOUVAIN 1996
  • MONTE-CARLO SIMULATION OF MULTIPHONON CAPTURE MECHANISM BY DEEP NEUTRAL IMPURITIES IN SI IN THE PRESENCE OF AN ELECTRIC-FIELD
    Author-s: PALMA, A; JIMENEZTEJADA, JA; GODOY, A; MELCHOR, I; CARTUJO, P
    Source: JOURNAL OF APPLIED PHYSICS 78 9 5448 5453 1995
  • COMPREHENSIVE MONTE-CARLO SIMULATION OF THE NONRADIATIVE CARRIER CAPTURE PROCESS BY IMPURITIES IN SEMICONDUCTORS
    Author-s: PALMA, A; JIMENEZTEJADA, JA; MELCHOR, I; LOPEZVILLANUEVA, JA; CARCELLER, JE
    Source: JOURNAL OF APPLIED PHYSICS 77 5 1998 2005 1995
  • A MODEL FOR THE QUANTIZED ACCUMULATION LAYER IN METAL-INSULATOR-SEMICONDUCTOR STRUCTURES
    Author-s: LOPEZVILLANUEVA, JA; MELCHOR, I; GAMIZ, F; BANQUERI, J; JIMENEZTEJADA, JA
    Source: SOLID-STATE ELECTRONICS 38 1 203 210 1995
  • A NONDESTRUCTIVE METHOD TO DETERMINE IMPURITY-PROFILES IN NONABRUPT P-N-JUNCTIONS WITH DEEP LEVELS
    Author-s: JIMENEZTEJADA, JA; LOPEZVILLANUEVA, JA; CARTUJO, P; CARCELLER, JE
    Source: SOLID-STATE ELECTRONICS 35 12 1729 1736 1992
  • IMPORTANCE OF THE CHOICE OF THE PROFILE MODEL FOR A P-N-JUNCTION IN THE LOCATION OF DEEP LEVELS
    Author-s: JIMENEZTEJADA, JA; LOPEZVILLANUEVA, JA; CARTUJO, P; VICENTE, J; CARCELLER, JE
    Source: JOURNAL OF ELECTRONIC MATERIALS 21 9 883 886 1992
  • A HIGH-FREQUENCY BIDIRECTIONAL CAPACITANCE METHOD TO STUDY THE EVOLUTION OF THE INTERFACE STATE DENSITY GENERATED AT LOW-TEMPERATURES
    Author-s: LOPEZVILLANUEVA, JA; JIMENEZTEJADA, JA; CARTUJO, P; BAUSELLS, J; CARCELLER, JE
    Source: SOLID-STATE ELECTRONICS 35 1 73 81 1992
  • ANALYSIS OF THE EFFECTS OF CONSTANT-CURRENT FOWLER-NORDHEIM-TUNNELING INJECTION WITH CHARGE TRAPPING INSIDE THE POTENTIAL BARRIER
    Author-s: LOPEZVILLANUEVA, JA; JIMENEZTEJADA, JA; CARTUJO, P; BAUSELLS, J; CARCELLER, JE
    Source: JOURNAL OF APPLIED PHYSICS 70 7 3712 3720 1991
  • ANALYSIS OF A REVERSE-BIASED LINEARLY GRADED JUNCTION WITH HIGH-CONCENTRATION OF DEEP IMPURITIES
    Author-s: LOPEZVILLANUEVA, JA; JIMENEZTEJADA, JA; CARTUJO, P; MORANTE, JR; CARCELLER, JE
    Source: SOLID-STATE ELECTRONICS 33 7 805 811 1990
  • Contribution of injection in current noise due to generation and recombination of carriers in p-n junctions
    Author-s: Tejada, JAJ; Godoy, A; Palma, A; Cartujo, P
    Source: JOURNAL OF APPLIED PHYSICS 90 8 3998 4006 2001
  • Determination of the concentration of recombination centers in thin asymmetrical p-n junctions from capacitance transient spectroscopy
    Author-s: Tejada, Juan A. Jimenez; Bullejos, Pablo Lara; Villanueva, Juan A. Lopez; Gomez-Campos, Francisco M.; Rodriguez-Bolivar, Salvador; Deen, M. Jamal
    Source: APPLIED PHYSICS LETTERS 89 11 -1 -1 2006
  • Model for the injection of charge through the contacts of organic transistors
    Author-s: Lara Bullejos, P.; Jimenez Tejada, J. A.; Rodriguez-Bolivar, S.; Deen, M. J.; Marinov, O.
    Source: JOURNAL OF APPLIED PHYSICS 105 8 -1 -1 2009
  • Unified model for the injection and transport of charge in organic diodes
    Author-s: Bullejos, Pablo Lara; Tejada, Juan A. Jimenez; Deen, M. J.; Marinov, O.; Datars, W. R.
    Source: JOURNAL OF APPLIED PHYSICS 103 6 -1 -1 2008
  • Theory of microplasma fluctuations and noise in silicon diode in avalanche breakdown
    Author-s: Marinov, Ognian; Deen, M. Jamal; Tejada, Juan Antonio Jimenez
    Source: JOURNAL OF APPLIED PHYSICS 101 6 -1 -1 2007
  • Effects of oxygen related defects on the electrical and thermal behavior of a n( )-p junction
    Author-s: Tejada, JAJ; Godoy, A; Carceller, JE; Villanueva, JAL
    Source: JOURNAL OF APPLIED PHYSICS 95 2 561 570 2004
  • INFLUENCE OF THE POSITION OF DEEP LEVELS ON GENERATION-RECOMBINATION NOISE
    Author-s: GODOY, A; PALMA, A; JIMENEZTEJADA, JA; CARCELLER, JE
    Source: APPLIED PHYSICS LETTERS 67 24 3581 3583 1995
  • EVOLUTION OF ELECTRICAL MAGNITUDES IN GRADUAL P-N-JUNCTIONS WITH DEEP LEVELS DURING THE EMISSION OF MAJORITY CARRIERS
    Author-s: JIMENEZTEJADA, JA; LOPEZVILLANUEVA, JA; CARTUJO, P; VICENTE, J; CARCELLER, JE
    Source: JOURNAL OF APPLIED PHYSICS 72 10 4946 4953 1992
  • Quantum two-dimensional calculation of time constants of random telegraph signals in metal-oxide-semiconductor structures
    Author-s: Palma, A; Godoy, A; JimenezTejada, JA; Carceller, JE; LopezVillanueva, JA
    Source: PHYSICAL REVIEW B 56 15 9565 9574 1997
  • ACCURATE DETERMINATION OF MAJORITY THERMAL-CAPTURE CROSS-SECTIONS OF DEEP IMPURITIES IN P-N-JUNCTIONS
    Author-s: PALMA, A; JIMENEZTEIADA, JA; BANQUERI, J; CARTUJO, P; CARCELLER, JE
    Source: JOURNAL OF APPLIED PHYSICS 74 4 2605 2612 1993
  • MONTE-CARLO STUDY OF THE STATISTICS OF ELECTRON-CAPTURE BY SHALLOW DONORS IN SILICON AT LOW-TEMPERATURES
    Author-s: PALMA, A; JIMENEZTEJADA, JA; GODOY, A; LOPEZVILLANUEVA, JA; CARCELLER, JE
    Source: PHYSICAL REVIEW B 51 20 14147 14151 1995
  • Random telegraph signal amplitude in submicron n-channel metal oxide semiconductor field effect transistors
    Author-s: Godoy, A; Gamiz, F; Palma, A; JimenezTejada, JA; Carceller, JE
    Source: APPLIED PHYSICS LETTERS 70 16 2153 2155 1997
  • DENSITY-OF-STATES OF A 2-DIMENSIONAL ELECTRON-GAS INCLUDING NONPARABOLICITY
    Author-s: LOPEZVILLANUEVA, JA; GAMIZ, F; MELCHOR, I; JIMENEZTEJADA, JA
    Source: JOURNAL OF APPLIED PHYSICS 75 8 4267 4269 1994
  • A COMPREHENSIVE MODEL FOR COULOMB SCATTERING IN INVERSION-LAYERS
    Author-s: GAMIZ, F; LOPEZVILLANUEVA, JA; JIMENEZTEJADA, JA; MELCHOR, I; PALMA, A
    Source: JOURNAL OF APPLIED PHYSICS 75 2 924 934 1994
  • Charge transfer processes at the semiconductor/electrolyte interface for solar fuel production: insight from impedance spectroscopy
    Author-s: Bertoluzzi, Luca; Lopez-Varo, Pilar; Jimenez Tejada, Juan Antonio; Bisquert, Juan
    Source: JOURNAL OF MATERIALS CHEMISTRY A 4 8 2873 2879 2016
  • Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities
    Author-s: Simoen, E.; Aoulaiche, M.; dos Santos, S. D.; Martino, J. A.; Strobel, V.; Cretu, B.; Routoure, J. -M.; Carin, R.; Luque Rodriguez, A.; Jimenez Tejada, J. A.; Claeys, C.
    Source: ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY 2 11 205 210 2013
  • High Doping Density/High Electric Field, Stress and Heterojunction Effects on the Characteristics of CMOS Compatible p-n Junctions
    Author-s: Simoen, E.; Eneman, G.; Gonzalez, M. Bargallo; Kobayashi, D.; Luque Rodriguez, A.; Jimenez Tejada, J. -A.; Claeys, C.
    Source: JOURNAL OF THE ELECTROCHEMICAL SOCIETY 158 5 27 36 2011
  • Localization and quantification of noise sources in four-gate field-effect-transistors
    Author-s: Luque Rodriguez, A.; Jimenez Tejada, J. A.; Godoy, A.; Lopez Villanueva, J. A.; Gomez-Campos, F. M.; Rodriguez-Bolivar, S.
    Source: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS 23 4-5 285 300 7th Spanish Conference on Electron Devices FEB 11-13, 2009 Univ Santiago de Compostelea, Univ Santiago de Compostelea, Univ Santiago de Compostelea 2010

Conferences in ISI CPCI-Science

  • Influence of the Contact Effects on the Variation of the Trapped Charge in the Intrinsic Channel of Organic Thin Film Transistors
    Author-s: Awawdeh, K. M.; Jimenez Tejada, J. A.; Lopez Varo, P.; Lopez Villanueva, J. A.; Deen, M. J.
    Source: PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) 71 73 9th Spanish Conference on Electron Devices (CDE) FEB 12-14, 2013 Valladolid, Valladolid 2013
  • Influence of Dopant Profiles and Traps on the Low Frequency Noise of Four Gate Transistors
    Author-s: Luque Rodriguez, A.; Jimenez Tejada, J. A.; Lopez Villanueva, J. A.; Godoy, A.; Lara Bullejos, P.; Gomez-Campos, M.
    Source: NOISE AND FLUCTUATIONS 1129 585 588 20th International Conference on Noise and Fluctua JUN 14-19, 2009 Pisa, Pisa 2009
  • A model for the generation recombination noise in junction field effect structures: application to four-gate transistors
    Author-s: Tejada, J. A. Jimenez; Rodriguez, A. Luque; Godoy, A.
    Source: Noise and Fluctuations 922 105 110 19th International Conference on Noise and Fluctua SEP 09-14, 2007 Tokyo, Tokyo 2007
  • Effects of oxygen-related traps in silicon on the generation-recombination noise
    Author-s: Tejada, JAJ; Villanueva, JAL; Godoy, A; Carceller, JE; Gomez-Campo, FM; Rodriguez-Bolivar, S
    Source: Noise and Fluctuations 780 717 720 18th International Conference on Noise and Fluctua SEP 19-23, 2005 Salamanca, Salamanca 2005

Book chapters in ISI

  • Improvement of the k.p Approach for Describing Silicon Quantum Dots
    Author-s: Rodriguez-Bolivar, S.; Gomez-Campos, F. M.; Luque-Rodriguez, A.; Lopez-Villanueva, J. A.; Jimenez-Tejada, J. A.; Lara-Bullejos, P.; Carceller, J. E.
    Source: PROCEEDINGS OF THE 2009 SPANISH CONFERENCE ON ELECTRON DEVICES 124 127 7th Spanish Conference on Electron Devices FEB 11-13, 2009 Univ Santiago de Compostelea, Univ Santiago de Compostelea, Univ Santiago de Compostelea 2009
  • Effect of traps in the performance of Four Gate Transistors
    Author-s: Luque Rodriguez, A.; Jimenez Tejada, J. A.; Godoy, A.; Lopez Villanueva, J. A.; Gomez-Campos, F. M.; Rodriguez-Bolivar, S.
    Source: PROCEEDINGS OF THE 2009 SPANISH CONFERENCE ON ELECTRON DEVICES 132 135 7th Spanish Conference on Electron Devices FEB 11-13, 2009 Univ Santiago de Compostelea, Univ Santiago de Compostelea, Univ Santiago de Compostelea 2009
  • 3D Animations Used for Teaching
    Author-s: Gomez-Campos, F. M.; Rodriguez-Bolivar, S.; Luque-Rodriguez, A.; Lopez-Villanueva, J. A.; Jimenez-Tejada, J. A.; Lara-Bullejos, P.; Carceller, J. E.
    Source: 2009 EAEEIE ANNUAL CONFERENCE 200 204 20th Annual Conference of the European-Association JUN 22-24, 2009 Valencia, Valencia 2009
  • Characterization of impurities in GaInNAs pn junctions from capacitance transient spectroscopy
    Author-s: Tejada, J. A. Jimenez; Deen, M. J.; Bullejos, P. Lara; Villanueva, J. A. Lopez; Gomez-Campos, F. M.; Rodriguez-Bolivar, S.
    Source: 2007 Spanish Conference on Electron Devices, Proceedings 139 142 6th Spanish Conference on Electron Devices JAN 31-FEB 02, 2007 Madrid, Madrid 2007
  • A multijunction solar cell simulation program for the development of concentration systems
    Author-s: Villanueva, J. A. Lopez; Diaz, V.; Bolivar, S. Rodriguez; Tejada, J. A. Jimenez; Rodriguez, E.
    Source: 2007 Spanish Conference on Electron Devices, Proceedings 262 265 6th Spanish Conference on Electron Devices JAN 31-FEB 02, 2007 Madrid, Madrid 2007
  • Characterization of oxygen related defects in silicon p-n junctions
    Author-s: Tejada, JAJ; Villanueva, JAU; Godoy, A; Gomez-Campos, FM; Rodriguez-Bolivar, S; Carceller, JE
    Source: 2005 Spanish Conference on Electron Devices, Proceedings 37 40 5th Spanish Conference on Electron Devices FEB 02-04, 2005 Tarragona, Tarragona 2005
  • A simple model to analyze electron confinement and trapping in silicon nanodots
    Author-s: Villanueva, JAU; Tejada, JAJ; Palma, A; Bolivar, SR; Carceller, JE
    Source: 2005 Spanish Conference on Electron Devices, Proceedings 345 348 5th Spanish Conference on Electron Devices FEB 02-04, 2005 Tarragona, Tarragona 2005
  • Contribution of the carrier number fluctuation and mobility fluctuation on the RTS amplitude in submicron n-MOSFETs.
    Author-s: Godoy, A; Palma, A; Gamiz, F; Jimenez-Tejada, JA; Cartujo, P
    Source: NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATIONS, PROCEEDINGS OF THE 14TH INTERNATIONAL CONFERENCE 201 204 14th International Conference on Noise in Physical JUL 14-18, 1997 LOUVAIN, LOUVAIN 1997
  • Gate voltage and temperature dependencies of up and down times of RTS in MOS structures: A theoretical study
    Author-s: Palma, A; Godoy, A; Jimenez-Tejada, JA; Carceller, JE
    Source: NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATIONS, PROCEEDINGS OF THE 14TH INTERNATIONAL CONFERENCE 210 213 14th International Conference on Noise in Physical JUL 14-18, 1997 LOUVAIN, LOUVAIN 1997

Doctoral Dissertations supervised

  • Compact modeling of physical mechanisms in organic solar cells
    Author: Pilar López Varo
    Institution: Electrónica y Tecnología de Computadores (UGR),
    Dissertation date: 2017-01-10
    Supervision: Juan Antonio Jiménez Tejada, M. Jamal Deen
    Special mention: internacional
  • Modelado de Fenómenos de Histéresis y Contactos en Transistores Orgánicos Poliméricos
    Author: Karam M. Awawdeh
    Institution: Electrónica y Tecnología de Computadores (UGR),
    Dissertation date: 2013-04-22
    Supervision: Juan Antonio Jiménez Tejada
  • Desarrollo de herramientas de simulación para micro y nano dispositivos
    Author: Abraham Luque Rodríguez
    Institution: Electrónica y Tecnología de Computadores (UGR),
    Dissertation date: 2012-09-07
    Supervision: Juan Antonio Jiménez Tejada, Salvador Rodríguez Bolívar, Eddy Simoen
  • Modelado de Los Mecanismos Físicos y las Estructuras Constituyentes de un Transistor de Efecto Campo Organico
    Author: Pablo Lara Bullejos
    Institution: Electrónica y Tecnología de Computadores (UGR),
    Dissertation date: 2009-10-02
    Supervision: Juan Antonio Jiménez Tejada, M. Jamal Deen
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